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电子经纬仪在一测回水平方向标准偏差计量检定中两种方法比较 被引量:1

Comparison of Two Verification Methods for One Measuring-processStandard Deviation in the Horizontal Direction for an Electronic Theodolite
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摘要 一测回水平方向标准偏差是衡量经纬仪测量精度的主要指标之一。结合经纬仪计量检定规程的要求,从测量的原理、方法、不确定度分析等方面入手,对电子经纬仪一测回水平方向标准偏差计量检定的两种方法进行比较。结果显示,多齿分度台法和多目标法在测量途径上基本相同,其测量不确定度分析的结果也基本相符。可能是由于在实际的计量检定过程中,计量检定人员、环境条件变化或其他因素造成了测量结果略有差异。 Electronic theodolites have the advantages of providing quick and high-precision objective readings,and thus can reduce work intensity.In addition,the measurement results are easily entered onto a computer.This type of equipment is widely used in basic map surveying,such as in construction,the military,aviation,water conservancy,transportation,and earthquakes,and plays an extremely important role in measurement of deformation.To ensure measurement accuracy of electronic theodolites,metrological verification of the measurement accuracy indexes is crucial.One of the main indicators of theodolite measurement accuracy is the value of one measuring-process standard deviation in the horizontal direction.Using the requirements of the verification regulation and beginning with the measurement principle,method,and uncertainty analysis,a comparison of two verification methods was carried out for one measuring-process standard deviation in the horizontal direction for an electronic theodolite.The results indicated that the multi-tooth indexing table method and multi-objective method are performed in the same way,and the results of the uncertainty in measurement are consistent.This may be because during the actual process of metrological verification,changes in the metrological verification personnel,environmental conditions,or other factors caused the measured results to be slightly different.
作者 景琦
出处 《地震工程学报》 CSCD 北大核心 2015年第4期1132-1135,共4页 China Earthquake Engineering Journal
关键词 电子经纬仪 一测回水平方向标准偏差 多齿分度台法 多目标法 测量不确定度 electronic theodolite one measuring-process standard deviation in the horizontal direction multi-tooth indexing table method multi-objective method uncertainty in measurement
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