摘要
针对现行大功率IGBT器件测试方法总是基于高压大电流的危险测试环境及较高的费用和要求操作人员较高的技术水平等不足,设计提出一种简单、适用、安全、高效的大功率IGBT模块驱动测试方法,该方法基于24 V电源测试大功率器件,通过向IGBT发送2.5 k Hz、5 k Hz的PWM脉冲测试IPM(智能功率半导体)的耗散电流来确定IGBT是否完好。详细介绍了这种测试仪的总体设计方案、关键功能设计和电路原理解析。开发的新产品具有实际应用价值和广阔的市场前景。
Some disadvangtages exist in the current test method of high power IGBT devices,e. g.dangerous test environment of high voltage and large current,high cost,and requirements of high skill of the operators. So a kind of module driver test method is put forward in this paper. This method is simple,applicable,safe,and efficient. Based on the test of high power devices using 24 V power,it can determine whether IGBT intact through sending the 2. 5 k Hz and 5 k Hz PWM pulse to IGBT to test the dissipative current of IPM（ intelligent power semiconductor）. In the paper,the overall design scheme,the key function,and circuit principle analysis of the tester are introduced in detail. The developed new product has practical application value and wide market prospect.
出处
《承德石油高等专科学校学报》
CAS
2015年第3期25-29,共5页
Journal of Chengde Petroleum College
