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Degradation Mechanism of the Superconducting Transition Temperature in Nb Thin Films

Degradation Mechanism of the Superconducting Transition Temperature in Nb Thin Films
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摘要 Systemic measurements show that there is no 3D to 2D crossover in the reduction of the superconducting transition temperature Tc in Nb thin films. This result is consistent with all previous measurements while it is contrary to the prevailing understanding based on the interplay between proximity, localization, and lifetime broadening. Our study indicates that the decrease of Tc can be interpreted by the combined effects of electron-phonon coupling parameter λ and the defect scattering rate pw, being uniquely determined by their ratio λ/ρw. Other factors such as film thickness and irradiation do not produce additional effects beyond these two parameters. Systemic measurements show that there is no 3D to 2D crossover in the reduction of the superconducting transition temperature Tc in Nb thin films. This result is consistent with all previous measurements while it is contrary to the prevailing understanding based on the interplay between proximity, localization, and lifetime broadening. Our study indicates that the decrease of Tc can be interpreted by the combined effects of electron-phonon coupling parameter λ and the defect scattering rate pw, being uniquely determined by their ratio λ/ρw. Other factors such as film thickness and irradiation do not produce additional effects beyond these two parameters.
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第4期122-125,共4页 中国物理快报(英文版)
基金 Supported by the National Natural Science Foundation of China under Grant No 11104331 the National Basic Research Program of China under Grant No 2011CB921702
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