摘要
利用拉曼光谱技术,研究了三氯化铁插层掺杂的少层石墨烯薄片。通过G带拉曼成像可判明样品不同的插层掺杂部分及其掺杂程度。G带拉曼峰在双层石墨烯和四层石墨烯中分别为单峰和双峰的不同结构。在石墨烯边缘处,G带拉曼峰会比其内部多出1个本征的G0峰,说明石墨烯边缘仍然存在未经插层掺杂的石墨烯。经过插层的双层石墨烯2D带拉曼峰仍可拟合出4个洛伦兹峰。
This paper investigates the Fe Cl3- based few- layer graphene intercalation compound flakes based on the Raman spectroscopy. Different intercalated parts of the graphene flake and the corresponding doping level can be retrieved by the G band Raman mapping. The G band Raman spectrum consists of a single peak or double peaks for the bilayer and tetralayer graphenes,respectively. A surprising intrinsic G0 peak appears at the edges of the intercalated graphene, which suggests that the doped graphene is partially undoped at the edges. Furthermore for the bilayer graphene intercalation compound flake, the 2D band peak can fit with four Lorenztian peaks with different full width half maxima（FWHM）. This study provides a better understanding of the property of the electrically modified graphene.
出处
《科技导报》
CAS
CSCD
北大核心
2015年第5期13-17,共5页
Science & Technology Review
基金
国家自然科学基金项目(11474350)
国家重点基础研究发展计划(973计划)项目(2014CB921001)
中国科学院战略性先导科技专项(B类)(XDB07030200)
关键词
石墨烯
拉曼光谱
少层石墨烯插层化合物
三氯化铁基
graphene
Raman spectroscopy
few-layer graphene intercalation compounds
FeCl3-based
