摘要
"魂芯一号"(BWDSP100)芯片是一款性能优越的高端DSP处理器,适用于雷达信号处理、电子对抗、精确制导武器、通信保障等领域。针对基于4片BWDSP100芯片和2片ALTERA公司的高端FPGA芯片设计的某雷达信号处理机,用边界扫描测试技术设计了TPS(Test Project Set),以验证BWDSP100芯片的可测试性。同时对该雷达信号处理机的DDR2、FLASH等外围芯片进行了测试有效性验证。经过验证,不仅BWDSP100芯片具有较好的可测试性设计,外围芯片的测试效果也很好,使得该雷达信号处理机有较高的故障覆盖率。
The HunXin-1（BWDSP100）chip is a high performance IC chip.It is widely used in military field such as radar signal processing,electronic countermeasure,precision-guided weapons,communication support.We have used boundary-scan technology to design a test project set（TPS）for a radar signal process-ing board based on four BWDSP100 chips and two FPGA（ALTERA）.We were supposed to verify the test-ability of BWDSP100 chip and we have found that the BWDSP100 chip has good testability.And the testabili-ty of DDR2 chips and FLASH on the signal processing board is also verified.The radar signal processing board using the BWDSP100 chip has a high fault coverage.
出处
《雷达科学与技术》
2014年第6期645-648,共4页
Radar Science and Technology
