摘要
本文总结了电子产品可靠性预计从20世纪50年代产生至今60多年的发展历史,对已有的电子产品可靠性预计方法进行了分类,对常用的基于协变量模型和基于故障物理模型的两类重要预计方法分别进行了分析和比较。分析结果表明,针对不同特点、处于不同寿命周期阶段以及具有不同可靠性相关信息的电子产品应选取合适的可靠性预计方法,在更加全面和准确地预计其可靠性水平的同时,消除设计与工艺缺陷,提高其可靠性水平。
This paper summarized the development history of more than 60 years of reliability prediction for electronic products since 1950s. Most of the existing methods were included and classified. There are two common and important methods, Covariate-Models-based method and Physics-of-Failure-Models-based method were analysis and compared. The analysis results showed that we should choose proper reliability methods for electronic products with different characteristics, in different stage of life cycle and with different reliability related information, which will help to quantificationally predict reliability indexes of them in a more comprehensive and accurate way, eliminate the design and manufacturing defects and improve their reliability.
出处
《电子科学技术》
2014年第2期246-256,共11页
Electronic Science & Technology
关键词
可靠性预计
电子产品
协变量模型
故障物理模型
Reliability prediction
Electronic products
Covariate model
Physics of failure model
