摘要
ＰＺＴ压电陶瓷单边缺口恒载荷试样两面镀镍后在ＮａＯＨ溶液中动态充氢时能发生氢致滞后断裂．研究了氢致滞后断裂门槛应力强度因子和试样中可扩散氢浓度的定量关系．结果表明,氢致断裂归一化门槛应力场强度因子ＫＩＨ/ＫＩＣ(ＫＩＣ＝１．３４Ｍｐａ·ｍ１/２)随氢浓度对数的升高而线性下降,即ＫＩＨ/ＫＩＣ＝０．４－０．１５５ｌｎＣｏ．当Ｃｏ＝９．８４×１０－４%(对应充氢电流３００ｍＡ/ｃｍ２)时,ＫＩＨ＝０．０１ＫＩＣ．这表明,ＰＺＴ陶瓷具有极高的氢致开裂敏感性．
Hydrogen-induced delayed fracture of PZT ceramics during dynamic charging under constant load has been studied. The results show that the normalized threshold stress intensity of hydrogen-induced fracture, K-IH/K-IC(K-IC=1.34 MPa.-m(1/2)), decreased linearly with the logarithm of hydrogen concentration in the specimen, C-0, i.e., K-IH/K-IC= 0.4-0.155 In C-0. When C-0=9.84x10(-4)% corresponding to i=300 mA/cm(2) in the NaOH solution, K-IH=0.010K(IC)=0.013 MPa(.)m(1/2).
出处
《金属学报》
SCIE
EI
CAS
CSCD
北大核心
2002年第6期625-628,共4页
Acta Metallurgica Sinica
基金
国家自然科学基金50131160738
国家重点基础研究发展规划G19990650资助项目
关键词
PZT压电陶瓷
氢致开裂
氢浓度
PZT ceramic
hydrogen-induce delayed fracture
hydrogen concentration
