摘要
介绍了对一种进口微波放大器在静态条件下产生自激振荡的原因进行分析的案例。在保证不破坏原有现象和尽量保证样品完整性的前提下，采用各种技术手段，成功地进行了分析定位。确定导致样品自激振荡的直接原因是：第３级放大管反馈回路中的电容特性退化。
This paper introduces an analysis case of the abnormal self - oscillation on an imported microwave amplifier under static bias. A successful location was achieved using various techniques and methods, while the abnormal phenomenon was kept and the amplifier was kept as nondestructive as possible. It is confirmed that the degradation of a capacitance is responsible for the abnormal self - oscillation.
出处
《电子产品可靠性与环境试验》
2002年第1期9-13,共5页
Electronic Product Reliability and Environmental Testing
关键词
微波放大器
自激振荡
分析定位
可靠性
microwave amplifier
self - location
analysis and location
