摘要
描述了一个新研制的二维干涉图自动采样与处理的原理和由离散的采样数据进行波面拟合的数学模型,给出了一个干涉图自动采样与处理的实例。由于在该模型中利用了 Zernike 多项式系数协方差的增广矩阵,因而比用 Gram-Schmit 正交化法求 Zernike 多项式系数的方法更为简洁。所研制的干涉图自动采样与处理系统精度高,功能齐全,使用方便,适用于一般干涉图的事后处理。
This paper describes the principle of a newly developed system for the automatic sampling and processing of 2-D interferograms and the mathma- tical model of wavefront fitting from discrete sampling data.An example of the automatic sampling and processing of interferograms is given. By using the extended matrix of the convariances of the coefficients of Zernike polynomials,it is simpler and clearer to calculate of Zernike polynomials than by Gram-schmit orthogonalized method.The developed sampling and processing system has high accuracy and full-functions, it is easy to operate and usable for the post-processing of usual interferograms.
出处
《西安工业学院学报》
1991年第2期41-47,共7页
Journal of Xi'an Institute of Technology
关键词
干涉测量法
自动采样
interference
wavefront fitting
