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高线性度外延及注入GaAs Hall器件

High Linearity GaAs Hall D evices Fabricated byEpitaxial Growth an d Ion Implantation
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摘要 讨论了外延及注入制作的薄层 Ga As Hall器件如何获得高的磁线性度 .Ga As Hall器件的磁线性度在高磁场下会有偏离 ,但可以通过外延及注入的过渡层对有源区进行补偿 ,在合适的有源区和过渡区的浓度和厚度分布中 ,可以得到在 2 .5 T的强磁场下 ,± 0 .0 4 How to fabricate hig h linearity Hall devices in a thin active layer via epitaxial growth and ion impl a ntation technology are studied and a goo d result is presented.Although the varia tion of Hall voltage with calibrated mag netic flux density shows the increasing linearity error in high magnetic field,i f the proper carrier concentration distr ibution and its thickness in the active region and transition region can be cont rolled via implantation and epitaxial gr o wth,to compete the current in the active region,the linearity will be ±0.04% in high magnetic field of 2.5T.
作者 郑一阳
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第5期505-508,共4页 半导体学报(英文版)
关键词 Hall器件 霍尔器件 砷化镓 线性度 Hall devices active region and transition region dist ribution the linearity of ±0.04% in a hi gh magnetic field of 2.5T
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参考文献3

  • 1Petlenpaul E,et al.Siemens Forschungs-und Entwicklungsberichte Research and Development Reports Bd.11(1982)Nr.1,22
  • 2Hara T,et al.IEEE Trans Electron Devices,1982,ED-29(1):78
  • 3郑一阳 等.半导体学报,1985,6(4):413-413.

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