摘要
基于边界扫描的电路板测试性设计中 ,迫切需要解决“测试性改善程度一定时 ,如何权衡设计使得设计复杂性最小”的问题。本文首先深入分析了该问题 ,证明它是一个NP 完全问题 ,然后基于贪婪策略提出了求解问题的优化算法。仿真实验表明 ,该算法能够得到较优化的电路板测试性设计方案。
In the design for the testability of circuit boards based on boundary scan, it is needed to solve the problem of how to design optimally to minimize design complexity when testability improvement degree is definite In this paper, the problem is analyzed and is proved to be an NP complete problem Then, an optimal algorithm is proposed based on the greedy strategy Experiments show that the algorithm can generate an optimal design scheme
出处
《计算机工程与科学》
CSCD
2002年第2期73-76,共4页
Computer Engineering & Science
