摘要
本文叙述了低能γ射线反散射法测量塑料薄膜厚度的可能性,建立了塑料薄膜厚度与反散射γ线强度的关系式。研制了一套测 量装置,并对测量误差进行了分析。
The paper describes the possibility of measuring Thickness of plastic film by low-energy γ-ray backscattering techniques and establishes a comparison expression between thickness of plastic film and intensity of backscattering γ- ray. The paper also develops a set of measuring device, and analyses measuring errors.
出处
《自动化技术与应用》
2002年第1期61-62,共2页
Techniques of Automation and Applications
关键词
低能γ射线
反散射法
塑料
薄膜
厚度
low-energy γ-ray backscattering plastic film thickness
