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透射式GaAs光电阴极AlGaAs/GaAs外延层倒易点二维图分析 被引量:4

THE ANALYSIS ON THE RECIPROCAL SPACE MAPPING OF THE AlGaAs/GaAs EPITAXIAL LAYER IN THE TRANSPARENT GaAs PHOTOCATHODE
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摘要 本文介绍了摇摆曲线和倒易点二维图在评价晶格完整性时的特点 ,分析了透射式Ga As光电阴极样品 Al Ga As/Ga As外延层的倒易点二维图 ,获得了晶面弯曲以及Al Ga As外延层中 Al组份变化等方面的信息 ,为优化外延工艺提供了可靠的保证 . This paper illustrated the characteristics of rocking curve and reciprocal space mapping respectively.Through analysising on the reciprocal space mapping of AlGaAs/GaAs epitaxial layer of transparent GaAs photocathode,the deforming informations of the lattice and composition of the AlGaAs/GaAs epitaxial layer were obtained.This helps to optimize the MOCVD growth procedure of AlGaAs/GaAs epitaxial layer.
出处 《光子学报》 EI CAS CSCD 北大核心 2002年第3期312-316,共5页 Acta Photonica Sinica
关键词 ALGAAS/GAAS X射线衍射 光电阴极 倒易点二维图 砷化镓 透射式GAAS光电阴极 外延层 镓铝砷化合物 GaAs/AlGaAs X-ray diffraction Photocathode Reciprocal space mapping
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参考文献1

  • 1(美)萨默AH 侯洵(译).光电发射材料[M].北京:科学出版社,1979.267-362.

同被引文献28

  • 1张峰翊,屠海令,钱嘉裕,王永鸿,宋萍,王敬.Raman Back-scattering study of Damaged and Strain Subsurface Layers in GaAs Wafers[J].Rare Metals,2000,19(3):179-182. 被引量:1
  • 2杨艳,薛晨阳,张斌珍,张文栋.用X双晶衍射法研究InGaAs/GaAs量子阱结构[J].半导体技术,2006,31(2):105-107. 被引量:2
  • 3陈京一,朱南昌,田亮光,李润身.In_xGa_(1-x)As/GaAs应变超晶格的X射线双晶衍射研究[J].Journal of Semiconductors,1990,11(11):855-858. 被引量:2
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