摘要
本文介绍了摇摆曲线和倒易点二维图在评价晶格完整性时的特点 ,分析了透射式Ga As光电阴极样品 Al Ga As/Ga As外延层的倒易点二维图 ,获得了晶面弯曲以及Al Ga As外延层中 Al组份变化等方面的信息 ,为优化外延工艺提供了可靠的保证 .
This paper illustrated the characteristics of rocking curve and reciprocal space mapping respectively.Through analysising on the reciprocal space mapping of AlGaAs/GaAs epitaxial layer of transparent GaAs photocathode,the deforming informations of the lattice and composition of the AlGaAs/GaAs epitaxial layer were obtained.This helps to optimize the MOCVD growth procedure of AlGaAs/GaAs epitaxial layer.
出处
《光子学报》
EI
CAS
CSCD
北大核心
2002年第3期312-316,共5页
Acta Photonica Sinica