摘要
研究了低能电子束在金属中衍射时势阱对电子束的折射效应 ,给出了一种用低能电子衍射法测定金属势阱深度的新方法 ,并以Cu ,Al和Ag膜为例计算了LEED(lowenergyelectrondiffraction)
The refraction effect of metallic potential well on low energy electron beam diffraction is investigated and a new method for measuring the depth of metallic potential well is given by using low energy electron diffraction. The refraction effect on LEED (low energy electron diffraction) is evaluated by using films of Cu, Al, and Ag as an illustration.
出处
《甘肃工业大学学报》
北大核心
2001年第3期114-116,共3页
Journal of Gansu University of Technology
