摘要
从理论上论述了常低温温度辐射测量方法的原理及其应用,并针对测量过程中所必须解决的被测物的发射率校正、校正误差计算以及利用特性方程进行温度定标等难题作了较为详细的分析。
The principle and the application of the temperature radiation measurement for normal and low temperature field are described theoretically in the paper. The detailed analysis for the difficult problems such as object emissivity correction, correction error calculation and the temperature scaling that must be solved during the measurement by means of the characteristic equation are carried out.
出处
《光电工程》
CAS
CSCD
北大核心
2001年第5期46-49,共4页
Opto-Electronic Engineering
关键词
辐射温度测量
辐射校正
辐射测量系统
Radiation temperature measurement
Emissivity correction
Correction errors
Radiation measuring systems .
