摘要
本文介绍用X射线粉晶衍射分析方法对夕线石在不同温度的烧制品中的莫来石进行定量分析;指出莫来石和矽线石的(220)峰可作为特征峰,并发现莫来石起始生成和完全莫来石化的温度随原料杂质和粒度因素而变化;认为d(020)=0.383 7nm,d(040)=0.191 7nm是矽线石JCPDS卡片中不曾标定的衍射峰,d(020)=0.3845nm是莫来石不曾标定的衍射峰,它们的强度变化是莫来石化行为特征之一。
Mullite and sillimanite are different in composition and similar in structure and other crystallographic characteristics. This article introduces the method for quantitative analysis to mullite in sillimanite products under different temperature with X-ray powber diffract(?)meter And points out the picks (220) of mullite and sillimanite can be as characteristic picks, and discovers that the temperature of sillimanite at the beginning to translate into mullite and those of entirly mullitization were different with the sillimanite purity and grain sizes. It suggets that the d (020)=0.383 7nm, d(040)=0.1916nm are sillimanite main picks, which have not been demarcated in JCPDS cards And d(020)=0.3845nm is the undemarcated mullite's pick .
出处
《矿物岩石》
CAS
CSCD
1991年第3期15-20,共6页
Mineralogy and Petrology
关键词
硅线石
莫来石
X射线
定量分析
mullite, sillima nite, X-ray diffraction, quantitative analysis
