摘要
受 EMP照射的微机系统，当 EMP场强达到一定数值时，其设备接口电路上即产生过电压或过电流，从而使设备受到干扰或损伤。本文设计了一种典型的微机并行接口单片机电路实验模型，介绍了该接口电路电磁脉冲耦合电压和耦合电流的测量方法，并对测得的数据进行了分析，得到了这类典型接口电路受到瞬时干扰和永久性损伤的电磁脉冲场强阈值。
Run under electromagnetic pulse(EMP),microcomputer can have over－ voltage or over－ current in it's interface circuit when EMP's intensity reach to certain value,and get interfered or damaged.In this paper,a typical single－ chip circuit is designed to simulate parallel interface of microcomputer,and a way of measuring coupling voltage and current is introduced.The measured data is analyzed,then the electromagnetic intensify peak value which causes transient and permanent failure of typical interface circuit is obtained.
基金
国家自然科学基金资助项目 (69971024)
