摘要
介绍一种以MCS - 5 1单片机为核心 ,利用霍尔集成电路、集成函数运算放大器、V/F转换器等构成的镀层厚度测试仪。文末给出了性能测试结果。该测厚仪适用于导磁工件上镀(涂 )有非导磁材料的镀 (涂 )层厚度的测量。
A plating thickness gauge with MCS 51 single chip computer as the kernel part is introduced. The gauge is composed of Hall IC, integrated function operational amplifier and V/F converter. The results of performance test are given finally. The gauge is suitable for the thickness measurement of non magnetic conducting plating (coating) on magnetic conducting workpieces.
出处
《自动化仪表》
CAS
北大核心
2001年第7期24-27,共4页
Process Automation Instrumentation
关键词
厚度测量
镀层
涂层
霍尔集成电路
线性化
单片机
Thickness measurement Plating Coating Hall Integrated circuit Linearization Single chip computer
