摘要
利用Ｘ射线光电子能谱（ＸＰＳ）剖析了低辐射涂层玻璃涂层表面到玻璃基面的元素浓度分布。结果表明，低辐射涂层具有多层结构，涂层表面由Ｔｉ和Ｏ组成，表面以下是Ａｇ，Ａｇ的下面又是Ｔｉ和Ｏ。低辐射涂层玻璃的结构可表述为：玻璃／ＴｉＯ２／Ａｇ／ＴｉＯ２，各层之间及底层与玻璃基体之间有互扩散现象。
The chemical composition and element distribution of low-emissivity layer coated glass were investigated by X-ray photo electron spectroscopy (XPS). The elemental profile demonstrates that the upper surface and the lower surface of the low-emis sivity layer are composed of Ti and O and the interlayer between them is composed of Ag. The construction of the low-emis sivity layer coated glass can be expressed as glass/TiO2/Ag/TiO2, and there is diffusion between sublayers and between the low er surface and glass.
出处
《分析仪器》
CAS
2001年第3期18-19,共2页
Analytical Instrumentation
基金
教育部骨干教师资助项目(生态建筑材料)
教育部科学技术重点项目(99087)。
