摘要
本文首次报道SiH_4在紫外区多光子电离的分质量光谱。没有检测到SiH_4^+;SiH-2^+和SiH_3^+是主要产物、SiH^+很少。与同步辐射的实验结果相比,SiH_2^+/SiH_3^+的比例相近,但Si^+明显增强。在358-367nm,各碎片离子光谱有大体一致的形状;在377-393nm,Si^+光谱中有多出来的谱带。分析表明较多Si^+可能来自SiH_n^+的后续解离过程。
UV MPI spectra for fragment ions of SiH_4 have been first observed using dye laser as a light source and TOF mass spectrometer for ion detection. No SiH_4^+ can be found. SiH_2^+ and SiH_3^+ are main products, and SiH^+ is scarce. Comparing to the results of synchrotron radiation, the ratio of SiH_2^+/ SiH_3^+ is in agreement, however, Si^+ is much stronger. In the region of 358-367nm the fragment ion spectra have similar figures. In the region of 377-393nm some additional bands appear in the Si^+ spectrum. Most of those extra Si^+ are probably produced from the succeeding dissociation of SiH_n^+.
基金
中国科技大学与日本东京大学合作研究项目
