摘要
用Ti/Cu/Ti多层中间层在 12 73K进行氮化硅陶瓷部分瞬间液相连接 ,实验考察了保温时间对连接强度的影响。用SEM ,EPMA和XRD对连接界面进行微观分析 ,并用扩散路径理论 ,研究了界面反应产物的形成过程。结果表明 :在连接过程中 ,Cu与Ti相互扩散 ,形成Ti活度较高的液相 ,并与氮化硅发生反应 ,在界面形成Si3N4 /TiN/Ti5Si3+Ti5Si4 +TiSi2 /TiSi2 +Cu3Ti2 (Si) /Cu的梯度层。
The partial transient liquid phase(PTLP) bonding of silicon nitride was carried out at 1?273?K with Ti/Cu/Ti multi interlayer. The effect of bonding time and interfacial reaction on the joint strength were investigated and the interfacial microstructures were observed and analyzed using SEM, EPMA and XRD respectively. The formation and transition processes of interface layer sequence at the interface were discussed by diffusion path. It is shown that Cu Ti transient liquid alloy forms on the surface of silicon nitride and reacts with silicon nitride on the interface at 1?273?K, forming the Si 3N 4/TiN/Ti 5Si 3+Ti 5Si 4+TiSi 2/TiSi 2+Cu 3Ti 2(Si)/Cu gradient interface. Owing to the variation of concentration in transient liquid, the diffusion path in the subsequent reaction changes. According to the microstructural analyses, the joint strength is affected by the thickness of reaction layer and the amount of residual thermal stresses which are affected by the bonding time. [
出处
《中国有色金属学报》
EI
CAS
CSCD
北大核心
2001年第2期273-278,共6页
The Chinese Journal of Nonferrous Metals
关键词
部分瞬间液相连接
氮化硅
扩散路径
界面反应
连接强度
陶瓷
钎焊
partial transient liquid phase bonding
silicon nitride
interface reaction
diffusion path
bonding strength
