摘要
参数漂移模型描述了元件参数从额定值发生偏移的行为。随着可靠性朝无故障寿命或无需维修工作周期的方向发展 ,对产品的参数漂移进行研究越来越显重要。利用 MΦ Itoft统计模型描述了电子元件的参数漂移行为 ,通过元件的早期寿命测试来预测元件寿命 。
Parametric drift model describes behaviosr of components as they drift away from their nominal valuse. Study on parametric drift behavior is much more important as reliability is developing toward failure free or maintenance free operating. With MΦItoft statistical model, parametric drift behaviors of electronic components are described, and lifetime of components predicted on the basis of early life measurements. An example is given.(3 refs.)
出处
《电子元件与材料》
CAS
CSCD
北大核心
2001年第1期1-2,4,共3页
Electronic Components And Materials
关键词
电子元件
参数漂移
MφItoft统计模型
electronic component
parametric drift
wear out
MΦItoft statistical model
