摘要
近 2 0年来 ,为了解决结构日益复杂的电路测试问题 ,可测试性技术得到了迅速发展。在可测试性技术中 ,针对不同的测试对象 ,如何对可测试性设计方案以及测试策略进行优化 ,降低总体代价 ,是亟待解决的问题。为了解决这两类典型的优化问题 ,首先应用图论方法建立问题的拓扑描述模型 ,然后通过构造相应的逻辑求解函数 ,给出问题最优解的求解算法 。
During the last decade, in order to solve the test problem of complex electronic system, the concept of testability has been accepted by more and more researchers and engineers. Its techniques have also developed very quickly. In testability, how to optimize the design and test approach of various systems to reduce the total cost is very important. Applying topology theory, we build up the topological descriptive model of the two typical optimization problems in testability, and then develop their optimal solving algorithms respectively.
出处
《国防科技大学学报》
EI
CAS
CSCD
2000年第6期105-108,共4页
Journal of National University of Defense Technology
基金
国家部委项目资助!(19.6 .5 .2 )
