摘要
X荧光光谱是检验标准物质均匀性常用的方法之一。制样和仪器的漂移是重要的误差来源。强度或表观浓度的测定误差通常小于浓度的测定误差。XRF分析中真正的取样量应是极限厚度内实际起作用的这部分样品。该数量符合一般标准物质均匀性检验的取样量。判断标准物质均匀性的关键是不均匀性误差的大小是否符合该标准物质对均匀性的要求。本工作为均匀性检验的数据处理编制了一个方便、实用的计算机程序。
XRF is one of common methods used for testing homogeneity of CRM's. In the testing, errors caused by sample preparation and instrumental drift are main sources of error. Determining errors of intensity or apparent concentration are generally less than ones of concentration. The real sample weight in XRF analysis should be that portion of sample within critical thickness, which ususlly meets requiment of sample weight needed for testing homogeneity of CRM's. The key of judging homogeneity of CRM's is that whether heterogeneity error meets the requiment for homogeneity of CRM's. A practical computer programm with many statistic informations has been made in our work.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1991年第3期62-65,39,共5页
Spectroscopy and Spectral Analysis
