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ICP-AES中基体连续辐射背景的研究——Ⅰ.基体连续背景的特性 被引量:6

A STUDY OF MATRIX CONTINUUM BACKGROUND IN ICP-AES Ⅰ. Characterization of the Matrix Background
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摘要 引言在“低温”等离子体光源中,一般只需考虑两种产生连续辐射背景的机制:电子—离子复合辐射轫和致辐射。Batal等对连续辐射背景的研究只是局限于工作气体Ar的复合辐射,其绝对强度的测量可用来计算ICP中电子密度和电子温度T_e。实际上,就干扰而言,Ar连续辐射背景的研究并不重要,因为其背景值不难用空白给予扣除。但是,本文发现一些基体如Ca、Mg。 A number of matrix elements (K, Al, Ca, Cr, Ni, Mg, Cu, Fe, Zn) with ionization potential ranging from 4.3 eV to 9.3 eV and with different atomic structures were selected for the continuum background study. The object of this paper is to investigate the characteristic of the matrix continuum background and its wavelength range, and to provide basic information for the identification and compensation of the background shift accurately and precisely. The experimental results showed that the continuum are closely related to the atomic structure and the ionization potential of the matrix elements. The discrepancy between the calculated results and the experimental obsered ones showed that the continuum radiation emitted by the matrices can not be explain simply by the conventional recombination model. Since most of the matrix elements are highly ionized in the ICP source, an ion-capture-electron model probably exists.
出处 《光谱学与光谱分析》 SCIE EI CAS CSCD 北大核心 1991年第1期38-43,80,共7页 Spectroscopy and Spectral Analysis
基金 国家自然科学基金 高等院校博士学科点专项科研资金
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