摘要
在自编程序下,用高分辨器件与二维OMA联合使用将波长校准精度从高于1埃提高到小于0.05埃。
We have enhanced the precision of calibrating wavelength from over 0.1 nm to 0.005nm with a optical accessory and normal 2-demension OMA. A program made by us is used on acqurement and calculation of spetra.
出处
《光电子．激光》
EI
CAS
CSCD
北大核心
1991年第3期143-145,147,共4页
Journal of Optoelectronics·Laser
