摘要
利用 X射线衍射技术 ,Instron电子拉伸机和透射电子显微镜 ,本文对退火后 Si Cw/p- Al和 Si Cw/60 61 Al复合材料位错密度和屈服强度进行了研究 .结果表明 ,经过退火后的 Si Cw/p- Al复合材料基体位错密度随加热温度升高而下降 ,但微屈服强度、屈服强度增加 ;而 Si Cw/60 61 Al复合材料基体位错密度在 2 50℃保温时略高 ,且其屈服强度变化趋势与位错密度变化趋势一致 .
By means of XRD technique, Instron Tensile tester and TEM, the paper deals with the dislocation density in matrix around the whiskers, micro-yield strength and yield strength for SiCw/p-Al and SiCw/6061Al composites after different annealing treatments. The results show that the dislocation density in matrix of SiCw/p-Al composites decreases with annealing temperature rising, while the micro-yield strength and yield strength of SiCw/p-Al increases. The dislocation density in matrix, micro-yield strength and yield strength of SiCw/60601Al composite annealed at 250℃ for 2h is a little higher.
出处
《佳木斯大学学报（自然科学版）》
CAS
2000年第3期205-208,共4页
Journal of Jiamusi University：Natural Science Edition
