摘要
介绍了一种基于晶体斜劈的偏振光相位延迟量的精密测量方法,并将该方法用于测量零级和多级石英波片相位延迟量的温度特性。该测量方法不受光源功率波动的影响,相位测量精度可以达到0.05°。相比于传统的测量方法,晶体斜劈方法在相位测量过程中无需调节光学元件,可以实时地测量相位变化,而且该方法可用于任意光学元件引入相位延迟的精确测量,或推广到不同的光学波段。
An accurate measurement method of the polarized light＇s phase retardation based on the crystal wedge is introduced, and is applied to measure the phase retardation＇s temperature dependence of the zero- and multiple-order quartz wave plates. The measured results are insensitive to the power fluctuation of the light source, and the accuracy of the phase measurement can reach O. 05°. Compared to the traditional phase measurement, there is no adjustment of any optical components during the crystal wedge＇s experiments, the on-line phase detection can be realized. This method can be used at the phase retardation measurement of any optical components, or at the various optical wavelengths.
出处
《光学学报》
EI
CAS
CSCD
北大核心
2014年第2期127-131,共5页
Acta Optica Sinica
基金
国家自然科学基金(51177016)
福州大学人才引进科研启动经费(022499)
关键词
物理光学
相位延迟量
单发测量
晶体斜劈
physical optics
phase retardation
on-line measurement
crystal wedge
