期刊文献+

3mm厚大口径超薄元件双面抛光工艺 被引量:5

Double-side polishing of 3mm large-aperture ultra-thin component
在线阅读 下载PDF
导出
摘要 基于环摆双面抛光技术,研究了3mm厚大口径超薄元件的双面抛光加工工艺。通过对双面抛光原理的分析,对转速比、抛光垫面形、抛光液等工艺参数上作了优化,并通过加工模拟进行验证。通过工件环分离器减薄技术解决了3mm厚超薄元件的装夹问题。在SYP152双面主动抛光机上进行了加工工艺实验,通过调节转速比实现3mm厚大口径超薄元件面形的高效收敛,验证了加工的可行性,并且达到了面形精度优于1.5λ(λ=632.8nm)、表面粗糙度优于1nm的技术水平。 We studied the double side polishing process of large aperture ultra thin component based on the technology of ring polishing and pendulum. The technical optimization included the speed ratio control, polishing pad shape modification and polishing particle size convergenee. Computer simulation produced evidence in support of the optimization. The trouble of uhra~ thin component's damage in original separator was overcome by material replacement and separator thinning. We achieved the convergence of surface shape by adjusting the speed ratio on SYP152 double-side polishing machine. Through these experiments, we verified the feasibility of this processing method, the surface PV value could attain to less than 1.5λ(λ=632.8nm), the surface roughness could be reduced to less than 1 nm.
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2013年第12期3315-3317,共3页 High Power Laser and Particle Beams
基金 国家高技术发展计划项目
关键词 双面抛光 大口径超薄元件 工艺优化 转速比 加工模拟 double side polishing large aperture ultra thin component process optimization speed ratio machining simulation
  • 相关文献

参考文献10

  • 1Atherton J, Montesanti R, Aikens D, et al. Producing NIF'Soptics[R].UCRL-LR-105821 97-3, 1997.
  • 2Campbell J H, Hawley Fedder R A, Stolz C J, et al. NIF optical materials and fabrication technologies: An overview[C]//Proc of SHE. 200,1, 5341: 84 -101.
  • 3Shore P, Moranls P, Luo X, et al. Big OptiX ultra precision grinding/measuring system[C]//Proc of SPIE. 2005, 5965:241 -248.
  • 4Ferme J J, Valla D, Ferriou-Daurios N, et al. LIL fused silica lenses and thin flat plates production[C]//Proc of SPIE. 2004, 5252: 35-45.
  • 5Frank C, Brown N, Prochnow E. Annular lapping of precision optical {latware[J]. Optical Engineering, 1976, 15(5): 407-415.
  • 6Preston F W. (.?lass technology[J]. Journal. the Society of Class Technology, 1927, 11(24) : 277-281.
  • 7Zhao Yongwu, Chang I,. A micro contact and wear model {or chemical mechanical polishing of silicon wafer[J]. Wear, 2002, 252(3/4): 220- 226.
  • 8Fu G H, Chandra A, Guha S A. Plasticity based model of material removal in chemical-mechanical polishing(CMP)[J]. IEEE Trans on Semiconductor Man,fracturing, 2001, 14(4) : 1698 1701.
  • 9Runnrls S R, Eyman L M. Trihology analysis of chemical-mechanical polishing[J]. Electro(hem Society, 1994, 14(6) : 69-71.
  • 10Liu Yuling, Tan Baimei, Zhang Kailiang. The underlay material pe, rformance and process and tes technology of SLSI. Beijing: Metallurgy Industry Press, 2002.

同被引文献66

引证文献5

二级引证文献15

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部