摘要
本文叙述“晶粒度和点阵畸变”的测量原理，讨论了日本国理学电机公司该应用软件（ＶＥＲ４．２０）中存在的问题及其对测试结果的影响．
This article describes the principle of the crystallite size and lattice distortion measurement and discusses the cristing problem in the software (VER4.20) or the Rigaku Company and its effecets on the measured results.
出处
《福州大学学报（自然科学版）》
CAS
CSCD
1991年第1期106-109,共4页
Journal of Fuzhou University(Natural Science Edition)
关键词
X-射线
晶粒度
点阵畸变
软件
X-ray
crystallite size
lattice distortion
software
