期刊文献+

自动阻抗调配器的校准技术探讨 被引量:2

Explore on Calibration Technology of Automatic Tuner
在线阅读 下载PDF
导出
摘要 自动阻抗调配器在微电子行业应用越来越广泛,但是目前国内还没有计量技术机构开展该类仪器的计量校准工作,本文介绍了其机械结构、工作原理,设计了控制模型,组建了校准系统,实现了主要参数矢量重复性、驻波比和插入损耗的校准工作。 Automatic tuner is widely used more and more in the microelectronics industry, But there are no such measurement institutions to carry out the calibration work of tuner. This paper describes the mechanical structure, working principle and design of the control model, set up a calibration system to a- chieve calibration work of the main parameter vector repeatability, VSWR and insertion loss.
出处 《宇航计测技术》 CSCD 2013年第5期19-22,共4页 Journal of Astronautic Metrology and Measurement
关键词 阻抗调配器 矢量重复性 驻波比 插入损耗 Automatic tuner Vector repeatability VSWR Insertion loss
  • 相关文献

参考文献4

  • 1U. Lott, "Measurement of magnitude and phase of har- monics generated in nonlinear microwave two-ports," IEEE Trans. Microwave Theory Tech. , vol. 37, no. 10: 1 506- 1 511, Oct. 1989.
  • 2F. Deshours, " Experimental comparison of load-pull measurement systems for nonlinear power transistor char- aeterization," IEEE Trans. Instrum. Meas. , vol. 46, no. 6:1 251 -1 255. Dee. 1997.
  • 3V. Adamian and P. Phillips, "Programmable Broadband Electronic Tuner," U.S. Patent No. 5 034 708, July 23, 1991.
  • 4Gary Simpson and David Ballo. "Ultra-fast, Simpler and More Accurate Noise Parameter Measurements". Micro- wave Journal, March, 2010 (Vol. 53, No. 3): 8-2.

同被引文献13

  • 1Friis H. T. Noise Figure of Radio Receivers[C]//Pro-ceedings of IRE, 1944,32:419-22.
  • 2Agilent Technologies. Fundamentals of RF and Micro-wave Noise Figure Measurements [Agilent ApplicationNote57-l][R]. 2001.
  • 3V. Adamian, R. Fenton* Verification of the Noise Pa-rameter Instrumentation[C]//49 th ARFTG ConferenceDigest, Denver, co, June 1997 : 181-190.
  • 4S. Van den Bosch, L. Martens. Deriving Error Boundson Measured Noise Factors Using Active Device Verifi-cation [C]//54th ARFTG Conference Digest, Dec.1999.
  • 5A. Frazer, E. Strid. Repeatability and Verification ofOn-wafer Noise Parameter Measurements[J]. Micro-wavejournal, 1988(11).
  • 6E. C. Valk,D. Routledge, J. F. Vaneldik,et al. De-Embedding Two-Port Noise Parameters Using a NoiseWave Model [J]. IEEE Transactions on Instrumenta-tion and Measurement,1988,37(2) : 195-200.
  • 7V. Markovic,B. Milovanovic,O. Pronic, et al. Ex-traction of Noise Wave Sources in MESFET Wave Rep-resentations [ C ]//Microwave and Millimeter WaveTechnology Proceedings, 1998, ICMMT 98,Aug. 18-20,1998:108-111.
  • 8G. L. Williams. Measuring Amplifier Noise on aNoise Source Calibration Radiometer[J]. IEEE Trna-sactions on Instrumentation and Measurement, 1995,44(2):340-342.
  • 9Haus. Optimum Noise Performace of Optical Ampli-fers[J]. IEEE Quantam Electrionics, 2001,37(6):813-823.
  • 10陈会,张玉兴.基于多谐波双向牵引技术的微波功率放大器设计[J].微波学报,2008,24(3):57-60. 被引量:12

引证文献2

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部