摘要
本文利用电子轰击(El.Eletron Impact)、化学电离(CI, Chemical Ionization)、解吸化学电离(DCI,Desorption Chemical Ionization)及快原子轰击(FAB,Fast Atom Bombardment)等不同质谱技术研究了β-羧乙基三氯锗的质谱特征,讨论了它们在FAB谱中与底物的缩合反应。
The EI, CI, DCI and FAB MS of β-carboxethyl germanium trichloride have been studied. From the results it can be seen that the Ge-Cl is the most active bond, so the fragments occur here easily. FAB MS for the compounds is very diagnostic because they react with matrices, glycerol and thioglycercl, to form new bonds of Ge-O and Ge-S instead of Ge-Cl bonds.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1991年第3期263-266,共4页
Chinese Journal of Analytical Chemistry
关键词
羧乙基三氯锗
质谱
锗有机化合物
β-Carboxethyl germanium trichloride, Fast atom bombardment mass spectometry, Matrix
