摘要
在集成电路的失效分析中,测试数据有非常重要的作用。从集成电路的三温电性能测试数据出发,论述了电性能测试数据与集成电路基本元器件参数的关系,对理清分析思路和揭示集成电路失效的根本原因有一定的帮助。
Test data play an important role in ICs failure analysis. Relationship between the electrical performance test data and the parameters of ICs basic components is discussed from the electrical performance test data of ICs under three-temperature. It helps to clarify thoughts and reveal root cause of ICs failure.
出处
《电子产品可靠性与环境试验》
2013年第5期1-5,共5页
Electronic Product Reliability and Environmental Testing
