摘要
本文从几何光学原理和射线跟踪法出发对微波暗室用吸波材料进行分析讨论 ,指出该材料的性能取决于角锥体界面上多次反射及材料内部的衰减 ,而这些又都决定于材料的 ε′和 ε″。利用计算机辅助分析和设计 ,使材料的吸收性能与材料的外形及参数相联系。
Applying the Geometrical Optical Principle and Tracing Method, analysis and dis cussion on the absorbing material used in microwave anechoic chambers are given. It shows that the performance of this kind of material depends on the multi-re flection on the pyramidal interface and the inner attenuation. All of these beha viors depend on the complex permittivity of the material. By means of CAA and CA D, association is established between absorbing performance and configuration al ong with parameters of the material.
出处
《微波学报》
CSCD
北大核心
2000年第4期389-398,406,共11页
Journal of Microwaves
