摘要
应用 Coulter DEL SA4 4 0 zeta电位仪测定一水草酸钙晶体表面的 zeta电位 ,研究高浓度草酸 ( 0 .2 mmol· L-1、 0 .4 mmol· L-1)对古糖酯 ( G872 )与一水草酸钙晶体粘附作用的影响 ;并应用 [3H]G872研究高浓度草酸下 G872在一水草酸钙晶体表面的粘附变化。结果表明高草酸下晶体表面的 zeta电位负值自 2 4 .5m V降低至2 0 .6m V,晶体表面的放射强度显著低于空白对照组 ( P<0 .0 5、P<0 .0 1) ,提示高草酸下只有较少的大分子聚阴离子大分子抑制物 (如 G872 )粘附到晶体表面 。
In our previous paper,we have addressed that the high concentration of oxalate interfered with the inhibitory activity of macromolecular weight inhibitors ,such as G 872 ,on calcium oxalate monohydrate 1 crystals growth and agglomeration.The current paper focused on the mechanism of this influence by using of zeta potential measurement.Meanwhile [ 3H]G872 was also employed to study the influence of oxalate on crystals and G 872 interaction.The results showed that the negative zeta potential values decreased from 24 5mV to 20.6mV and 18.7mV(G872)in present of high concentration of oxalate of 0.2mmol·L -1 and 0.4mmol·L -1 respectively,revealed either less G 872 binding to the crystal surface or weaker charged G 872 binding to the crystal surface of combination.However the less radioactivity of crystals with hot G 872 in present of high concentration of oxalate indicated exclusively less oxalate G 872 binding to the crystal surface.
出处
《中国海洋药物》
CAS
CSCD
2000年第5期16-19,共4页
Chinese Journal of Marine Drugs
