摘要
研究了超短超强激光与不同厚度薄膜Al靶相互作用中靶背法线方向碳离子的最初来源.通过对比分析碰撞电离率和场致电离率所起的作用,发现C4+及更低价态的碳离子主要由场致电离产生,而高价态的C5+和C6+离子主要来自于超热电子与靶表面的碰撞电离.
High charge state carbon ions are observed from the rear surface of thin foil irradiated by intense femtosecond laser pulse at intensities up to 6.4 × 10^18 W/cm2. The origin of the ions is studied by analyzing the basic ionization process occurring at the rear surface. It is shown that the normally dominant ionization process is field ionization by barrier suppression for charge states less than He-like （C4＋）, while collisional ionization is significant for C5＋ and C6＋.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2013年第16期260-265,共6页
Acta Physica Sinica
基金
国家自然科学基金(批准号:10925421
11135012
10974250
10935002)资助的课题~~
