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Cu2O薄膜的制备与表征 被引量:4

Electrodeposition and characterization of Cu_2O thin films
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摘要 以透明导电玻璃ITO和铜片为工作电极,用0.1mol/L乙酸铜和0.02mol/L乙酸钠的混合溶液作为电解液,通过两电极电化学沉积方法制备了Cu2O薄膜。讨论了pH值和沉积电位对Cu2O薄膜的影响,利用X射线衍射仪(XRD)、场发射扫描电子显微镜(SEM)、X射线光电子能谱(XPS)对薄膜进行表征。结果表明,两电极电化学沉积法制备Cu2O薄膜最佳的pH值为5.7~5.9,沉积电位为1.1~1.3V。此外,分析了沉积电位对Cu2O薄膜形貌的影响。 Cuprous oxide(Cu2O) films were fabricated by a two-pole electrodeposited method using indium-doped tin oxide(ITO) covered glass substrate and Cu strip.The influence of some technological factors(pH value,deposition potential) on Cu2O films was studied.The as-synthesized products have been systematically characterized by X-ray diffraction(XRD),scanning electron microscopy(SEM) and X-ray photoelectron spectroscope(XPS).The results indicate that the pH value and the applied potential play important roles in the Cu2O films.The optimum technological conditions are obtained as follows: the pH value is 5.7-5.9 and the applied potential is 1.1-1.3V.What's more,in this paper,we also put emphasize on the forming reasons of morphology of Cu2O.
出处 《功能材料》 EI CAS CSCD 北大核心 2013年第14期2056-2058,2061,共4页 Journal of Functional Materials
基金 国家自然科学基金资助项目(61106060) 国家高技术研究发展计划(863计划)资助项目(2012AA052401) 中国科学院知识创新工程重大资助项目(Y2YF028001)
关键词 CU2O 薄膜 阴极电沉积 表征 cuprous oxide electrodeposition thin film characterization
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