摘要
Two new chiral Schiff base acacen-derivative nickel（II） and copper（II） complexes have been prepared and characterized with IR, electronic, and CD spectra and X-ray crystallography. So-called artifact peaks of solid-state CD spectra due to restricted to rotate freely of molecules appeared at about 334 and 460 nm for nickel（II） and copper（II） complexes. Changes of intensity of the peaks have been investigated in different matrices such as solid-state （microcrystals or KBr pellets）, PMMA cast films and acetone solutions of various concentrations and pure acetone solutions. Although restricted orientation of molecules in rigid matrices leads to increase the peak intensity toward negative and positive optical rotation for nickel（II） and copper（II） complexes, respectively, the degree of increasing intensity depends on not concentration but viscosity of polymer solutions. Therefore, the artifact CD peaks of solid-state can act as an indicator of environmental viscosity of soft mater matrices.
