摘要
介质中被陷阱束缚的电荷载流子,通常以热发射或场致发射方式摆脱陷阱束缚,实现退陷阱化。本文在理论分析和实验证明的基础上,发现陷阱中的电荷载流子,还可以由第三种方式——碰撞电离来实现退陷阱化。理论分析建立了碰撞电离退陷阱化模型,并通过与实验结果相结合,给出了碰撞电离退陷阱化系数。碰撞电离退陷阱化可以作为介质击穿的先导。运用碰撞电离退陷阱化理论,不仅可以解释许多实验现象,而且对于电气设备生产和运行维护也具有重要的实际意义。
Cenerally, the charge carriers traped in a dielectric is detrapping by the way of thermal or field emission.In this paper, based on the theoretical analyze and experiment,we found the third way for charge carriers detrapping-impact ioniza- tion detrapping.The theoretical model of impact ionization detrapping is set up by further investigation.The parameter for impact ionization detrapping is obtained through the connection from the theory to the experiment practice.The impact ionization detr- apping can be taken as a forecasting symptom of dielectric breakdown.The theoretical model of impact ionization detrapping not only can explain much experiment phe- nomena, but also can be able to play an important role in practice.
出处
《电工技术学报》
EI
CSCD
北大核心
1991年第2期59-64,共6页
Transactions of China Electrotechnical Society
关键词
碰撞电离
陷阱
电介质
电荷载流子
Trap Detrapping Impact ionization Carrier Dielectric
