摘要
以VC串口控制为基础,以原子力显微镜的微悬臂为对象,分别对不同型号的信号发生器进行了程控扫频测试、对同一型号信号发生器的不同控制指令实现扫频进行了测试。实验证明,对于不同型号的信号发生器,频率变化速率不同,扫频速度也不同。而对于同一型号信号发生器,采用不同的控制指令也会影响扫频测试结果。为了更好地提高扫描速度,合理选用信号发生器型号及采用合适的指令进行扫频至关重要。
With VC serial control as the foundation and the atomic force microscope micro - cantilever as object, the SPC sweep test for different types of signal generator and frequency sweep for the same type of signal generator using differ- ent control instruction were tested respectively. Experiments show that rate of frequency variation is different for different types of signal generator, so the sweep speed is also different. For the same type of signal generator, the different control instruction can also affect the results of sweep test. In order to better improve the scanning speed, proper selection of the signal generator model and adopting appropriate instruction is vital important to sweep frequency.
出处
《工具技术》
2013年第6期57-59,共3页
Tool Engineering
基金
国家自然科学基金(50975075)
关键词
数字信号发生器
扫频
原子力显微镜
digital signal generator
sweep
atomic force microscope
