摘要
研制了一种基于压电双晶片的高灵敏度膨胀仪，它能够在较宽的频率范围内，可靠、方便地测量自由状态下又薄又软的共聚物薄膜最度方向的电场致应变，测试结果证明这种新型的膨胀仪在频率为１００Ｈｚ时能探测低于０．１ｎｍ的位移，最后测量了一种共聚物薄膜的电场致应变。
We report on a bimorph based dilatometer which is capable of measuring the electric field induced strain response in the out of plane direction of a thin and free standing polymer film samples conveniently over a relatively wide frequency range (1 Hz to 1 kHz). The test results demonstrate that the dilatometer is capable of detecting displacement down to the 0. 1nm range at 100 Hz. The agreement between the test results and the model analysis indicates that the device can indeed be used reliably for these measurements with high sensitivity.
出处
《武汉大学学报（自然科学版）》
CSCD
2000年第1期87-90,共4页
Journal of Wuhan University(Natural Science Edition)
基金
国家自然科学基金!(59973015)
(59943001)
清华大学新型陶瓷与精细工艺国家重点实验室开放基金
