摘要
通过对光谱仪的控制,对各项发光强度参数的计算与校准,在传统的探针设备基础上增加发光强度的测试过程,从而丰富探针设备的功能。目前设备已经达到红、黄、蓝光芯片的测试的要求,并在客户现场投入使用。主要总结归纳发光强度测量计算方法与实验结论。
Based on the light intensity of the color spectrum,parameter calculation and calibration,in the tradition of the probe device is added on the basis of color test process,thus enriching the probe device function.At present,the device has reached a red,yellow,blue chip testing requirements,and put into use at customer site.This paper mainly summarized the intensity measurement and calculation methods,and experimental results.
出处
《电子工业专用设备》
2013年第5期30-34,共5页
Equipment for Electronic Products Manufacturing
关键词
光谱仪
发光强度参数
计算与校准
Spectrum
Parameter of light intensity
Calculation and calibration
