摘要
针对20 cm氙离子推力器具体设计和工作参数,采用二维轴对称模型的网格质点和蒙特卡罗碰撞方法模拟计算了氙离子和氙原子在离子推力器栅极系统中的运动。模拟得到了在不同本底压力下交换电荷离子对加速栅极孔壁的溅射腐蚀情况,并由此计算了不同本底压力下因孔壁腐蚀导致发生电子反流失效模式的推力器工作寿命。
The motion of xenon atoms and ions in the grid system of the 20 cm Xe ion thruster,used in spacecrafts,was modeled and simulated with the software packages particle-in-cell and Monte-Carlo-Collision,to understand the possible mechanisms responsible for the electron-reflux failure.The inner-wall corrosion of the acceleration-grid hole,caused by sputtering of the charge-exchange Xe ions at different pressures,was simulated.The simulated results show that the electron-reflux failure and the ion thruster’s lifetime significantly depend on the pressure.For instance,at 6.67×10-3 Pa and 1.0×10-5 Pa,the ion thruster’s lifetimes were estimated to be 16550 h and 24458 h,respectively.We suggest that a pressure below 1.0×10-5 Pa may weakly affect the ion thruster’s lifetime.
出处
《真空科学与技术学报》
EI
CAS
CSCD
北大核心
2013年第3期253-256,共4页
Chinese Journal of Vacuum Science and Technology
基金
真空低温技术与物理重点实验室基金项目(9140C550211120C5501)
关键词
本底压力
电子反流
数值模拟
工作寿命
Background pressure
Electron backstreaming
Numerical simulation
Lifetime
