摘要
基于傅里叶分析的功率谱密度只能反映 1/f噪声的整体频率特性 ,子波变换模极大值能够反映 1/f噪声的奇异性和非规整性 ,而后者才是 1/f噪声最本质的特征所在 .本文将这一特性用于MOSFET 1/f噪声的相似性分析 .从子波变换模极大值匹配原理出发 ,定义了一个 1/f噪声的相似系数 ,利用它对不同形成机制、不同微观缺陷状态、不同偏置应力作用下的MOSFET 1/f噪声进行了相似性分析 ,发现它可作为鉴别 1/f噪声的物理起源 ,分析 1/f噪声的微观动力学机制 。
The power spectrum on Fourier transform is only a description of overall regularity of 1/ f noise,while the maxima of wavelet transform modulus can well measure local singularity and irregular structure in 1/ f noise.This is used to analyze the similarity of 1/ f noises in MOSFETs in this paper.Based on the matched maxima of wavelet transform modulus,a similarity coefficient is defined.Using the approach,the similarities of 1/ f noises in MOSFETs concerning different generation mechanisms,microscopic defects,and bias stresses are examined.It is shown that it can be used as an effective tool to identify the physical origin and microscopic dynamics of 1/ f noise,and also to screen the defective or damaged MOS devices.
出处
《电子学报》
EI
CAS
CSCD
北大核心
2000年第11期137-139,105,共4页
Acta Electronica Sinica
基金
国家自然科学基金! (No .69671 0 0 0 3)
陕西省自然科学基金! (No.98x0 5)
