摘要
依据对磁记忆效应的法向分量过零点及切向分量最大值位置同时进行检测的磁记忆二维检测原理,设计研制了以微处理器为核心的新型磁记忆检测仪器。并通过实际工件的检测,试验验证了仪器工作的可行性,可望为进一步开展磁记忆二维检测定量分析提供有效的方法和试验依据。
The zero point in normal component and the maximum point in tangential component were together adopted to detect. The inslrurnent was built with CPU and based on the principle of two-dimensional detection of magnetic memory. In addition, the test on the workpiece verified the feasibility of the instrument and showed that the instrument had good application prospects in the quantitative analysis of magnetic memory.
出处
《无损检测》
2013年第4期70-74,共5页
Nondestructive Testing
基金
国家自然科学基金资助项目(51065022)
江西省仪器科学与技术学科研究生教育创新基地资助项目
关键词
磁记忆检测
二维
向量合成
仪器设计
定量分析
Magnetic memory testing
Two dimension
Vector synthesis
Instrument design
Quantitative analysis
