摘要
像差校正电镜的出现,使人们可以从亚埃的尺度观察材料结构,从而可能给材料研究带来重大改变。以此为背景,第82期双清论坛"走向亚埃世界:材料界面工程中精细原子构型与其特性"于2012年10月21—23日在北京召开,来自国内外23个大学和科研院所的38名专家参加了这次论坛。论坛就球差矫正电镜的发展及其在材料结构观察和界面调制中的应用问题展开了热烈的讨论,凝练出了该领域的关键科学问题,对领域内需要重点发展及优先资助的方向提出了建议。
Aberration-corrected transmission electron microscope offers for the first time the materials re- searchers a possibility for characterizing materials structure at a sub-angstrom resolution level. This may bring important changes in materials science. Under this background, the 82nd Shuangqing Forum was held during 21st-23rd, October 2012 in Beijing, themed as Walk into a sub-angstrom world： atomic hyper- fine structure and characteristics in materials interface engineering＂. Thirty-eight experts and scholars from 23 universities and research institutions, both from domestic and abroad, attended the forum. The topics include the developments of Aberration-corrected transmission electron microscope, and its application in the observation and modulation of materials interface. After a lively discussion, the forum reached summa- rization of the key scientific issues of the field, and suggested highlights in the further Funding scheme.
出处
《中国科学基金》
CSSCI
CSCD
北大核心
2013年第3期129-132,153,共5页
Bulletin of National Natural Science Foundation of China
关键词
透射电子显微镜
像差校正
材料科学
transmission electron microscope, aberration-corrected, materials science
