期刊文献+

基于仿真的竞争失效产品步降加速寿命试验优化设计 被引量:1

Optimal design of accelerating life test of step-down-stress products based on simulation of competing risks
在线阅读 下载PDF
导出
摘要 针对竞争失效产品加速寿命试验存在试验时间长、费用高、效率低的问题,提出了一种基于Monte-Carlo仿真的竞争失效产品步降加速寿命试验优化设计方法。采用Monte-Carlo对步降加速寿命试验进行仿真模拟,以正常使用应力下的p阶分位寿命渐进方差估计最小为目标,以各试验应力水平及对应应力下的试验截尾数作为设计变量,采用MLE理论进行统计分析,建立了基于仿真的竞争失效产品步降加速寿命试验优化设计模型。最后,通过实例分析表明:该方法具有可行性、有效性。 Aiming at the problems of long test time, high cost and low efficiency during the accelerating life test of products with competing risks, this paper presents a method of Monte-Carlo simula- tion based on the optimal design of step-down-stress accelerating life test with competing risks. The Monte-Carlo was used to simulate the procedure of the test. With the asymptotic variance estimation of 100pth percentile of the minimum lifetime distribution of the product as an objective with each test stress level and the test censoring numbers of corresponding stress as design variables, and by use of MLE theory for statistic down acc sible and tion of el elerating effective life test so that analysis, the optimal designed model was established for simulating stepwith competing risks. The simulation results prove that this method is feait can provide a technical support for optimal design of AT in the life predicectronlc equipment.
出处 《海军工程大学学报》 CAS 北大核心 2013年第2期62-66,72,共6页 Journal of Naval University of Engineering
基金 河北省自然科学基金资助项目(109635529D)
关键词 竞争失效 加速寿命试验 MLE competing risk accelerating life test MLE
  • 相关文献

参考文献8

二级参考文献14

  • 1程依明.步进应力加速寿命试验的最优设计[J].应用概率统计,1994,10(1):52-61. 被引量:32
  • 2PASCUAL F. Accelerated life test planning with independent Weibull competing risks with known shape prameter [ J ]. IEEE Trans on Reliability, 2007, 56 ( 1 ) : 85 -93.
  • 3KLEIN J P, BASU A P. Weibull accelerated life test when there are competing causes of failure [ J ]. Comm Statist Theor Meth, 1981, A10(20) :2073-2100.
  • 4BA1 D S, CHUNG S W. Optimum design of partially accelerated life tests for the exponential distribution under type-I censoring [ J]. IEEE Trans on Reliability, 1992, 31 : 300-306.
  • 5BAI A P,CHUN J R. Optimum simple step stress accelerated life test with competing causes of failure [ J ]. IEEE on Reliability, 1991,31:622-627.
  • 6ZHAO W,ELSAYED E A. An accelerated life testing under competing failure modes [ C ]//The Annual Reliability and Maintainability Symposium, 2004 : 82-90.
  • 7D . S. Bai , M . S. Kim, S. H. Lee, OPtimum simple step - stress plans accelerated life testing with censoring[J]. IEEE Trans. Reliability , 1989,38 (5):528 - 532.
  • 8Bai D S,IEEE Trans Reliability,1991年,40卷,5期,622页
  • 9Bai D S,IEEE Trans Reliability,1989年,38卷,5期,528页
  • 10刘立喜,高校应用数学学报

共引文献39

同被引文献7

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部