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Space-Resolved VUV and EUV Spectrometers in HL-2A

Space-Resolved VUV and EUV Spectrometers in HL-2A
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摘要 A normal incidence vacuum ultraviolet (VUV) and a grazing incidence extreme ultraviolet (EUV) spectrometers have been developed for the edge and core impurity measure- ments in HL-2A tokamak. The VUV and the EUV spectrometers cover wavelength ranges of 300-3200 A and 50-500A, respectively. A spatial resolution of 2 mm has been achieved for the VUV spectrometer when a space-resolved slit 50 #m in width is used. The space-resolved slit is placed between the entrance slit and the grating of the spectrometer. The spectral resolutions of 0.15/~ for the VUV spectrometer in the wavelength coverage of the concave 1200 grooves/mm grating and of 0.22A for the EUV spectrometer at λ=200A with a flat-field laminar-type holo- graphic grating are obtained. The sensitivity of the VUV spectrometer was calibrated in situ with the plasma bremsstrahlung radiation. The experimental results from both spectrometers are presented, especially the line intensity radial profiles measured by the VUV spectrometer. A normal incidence vacuum ultraviolet (VUV) and a grazing incidence extreme ultraviolet (EUV) spectrometers have been developed for the edge and core impurity measure- ments in HL-2A tokamak. The VUV and the EUV spectrometers cover wavelength ranges of 300-3200 A and 50-500A, respectively. A spatial resolution of 2 mm has been achieved for the VUV spectrometer when a space-resolved slit 50 #m in width is used. The space-resolved slit is placed between the entrance slit and the grating of the spectrometer. The spectral resolutions of 0.15/~ for the VUV spectrometer in the wavelength coverage of the concave 1200 grooves/mm grating and of 0.22A for the EUV spectrometer at λ=200A with a flat-field laminar-type holo- graphic grating are obtained. The sensitivity of the VUV spectrometer was calibrated in situ with the plasma bremsstrahlung radiation. The experimental results from both spectrometers are presented, especially the line intensity radial profiles measured by the VUV spectrometer.
出处 《Plasma Science and Technology》 SCIE EI CAS CSCD 2013年第2期110-114,共5页 等离子体科学和技术(英文版)
基金 partially supported by National Natural Science Foundation of China (Nos. 10975048 and 11175061) the JSPS-NRF-NSFC A3 Foresight Program in the Field of Plasma Physics (No. 11261140328)
关键词 VUV spectra EUV spectra SPECTROMETER spatial resolution VUV spectra, EUV spectra, spectrometer, spatial resolution
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