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Influence of electron-beam superposition welding on intermetallic layer of Cu/Ti joint 被引量:3

Cu/Ti电子束叠加焊接对金属间化合物层的影响(英文)
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摘要 QCr0.8 was electron-beam welded to TC4 and the effect of the intermetallic layer (IMC-layer) on the mechanical properties of the joint was investigated. The IMC-layers are joint weaknesses at the Cu fusion line in centered welding and at the Ti fusion line when the beam is deviated towards Cu. A new method referred to as electron-beam superposition welding was presented, and the optimal welding sequence was considered. The IMC-layer produced by centered welding was fragmented and remelted during Cu-side non-centered welding, giving a finely structured compound layer and improved mechanical properties of the joint. The tensile strength of joint is 276.0 MPa, 76.7% that of the base metal. 对QCr0.8/TC4进行电子束焊接,研究焊缝中金属间化合物层(即IMC-layer)对接头力学性能的不利影响,提出利用电子束二次叠加焊接方式来改善接头性能的思路。结果表明,对中焊时在铜侧熔合线处形成的金属间化合物层,偏铜侧焊接时在钛侧熔合线处形成的金属间化合物层,是接头中的薄弱环节。利用电子束叠加焊接方式,须合理设计焊接顺序。先进行对中焊,再利用偏铜侧焊接,可将第一道焊缝形成的金属间化合物层破碎重熔,形成组织较好的化合物层,改善接头的力学性能。接头的抗拉强度为276.0MPa,达到了母材强度的76.7%。
出处 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2012年第10期2416-2420,共5页 中国有色金属学报(英文版)
基金 Project (2010CB731704) supported by the National Basic Research Program of China
关键词 Cu alloy Ti alloy electron beam superposition welding IMC-layer Cu合金 Ti合金 电子束叠加焊接 金属间化合物层
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