摘要
为了快速检测土壤的重金属污染程度,设计了一种X荧光测试仪。该测试仪采用Si-PIN半导体X射线探测器作为检测传感器、ARM S3C2440A作为控制与数据处理核心,并使用WXCAT35-TG3#001F显示/触摸屏控制测试仪显示测量结果。测试仪可通过RS-232接口与PC机进行数据通信,也可现场快速分析测试土壤中重金属As、Cr、Zn、Cu、Pb、Ni等的含量。实际应用结果表明,测试仪工作可靠、运行稳定,实现了土壤重金属污染的快速检测。
In order to detect the heavy metal pollution in soil quickly, the X-ray fluorescence tester is designed. The tester is composed of Si-PIN semiconductor X-ray detector as the detecting sensor, ARM $3C2440A for control and data processing, and WXCAT35-TG3 # 001F display/touch screen control instrument to display the measurement results. Through RS-232 interface, data communication between the tester and PC can be implemented. In addition, the contents of various heavy metals in soil, e. g. , As,Cr,Zn,Cu,Pb ,Ni, etc. , can also be analyzed quickly on site. The results of practical applications indicate that the tester operates reliably and stably ; it implements rapid detection of heavy metal pollution in soil.
出处
《自动化仪表》
CAS
北大核心
2012年第10期80-82,86,共4页
Process Automation Instrumentation
基金
2007年江苏省科技厅基金资助项目(编号:BS2007033)
关键词
X荧光
ARM
触摸屏
脉冲信号放大器
峰值检测
谱线
X-ray fluorescence ARM Touch screen Pulse signal amplifier Peak detection Spectral line
